Online Conference"Radiation Effects on Microelectronics"

Daniel Fleetwood is professor of electrical engineering and physics since 1999 at the Vanderbilt University, Nashville, Tennessee, USA. He has more than thirty years of experience in radiation effects domain. He currently serves as Senior Editor, Radiation Effects, for the IEEE Transactions on Nuclear Science journal, and owns a Distinguished Lecturers Chair for the IEEE Nuclear and Plasma Sciences Society. Prof. Daniel Fleetwood is a fellow of both the Institute for Electrical and Electronics Engineers and The American Physical Society, and a member of ASEE, Phi Beta Kappa, and Sigma Pi Sigma.

Giulio Borghello is a member of the CERN Microelectronics Section since 2016. He received his PhD in 2019 from the University of Udine with a thesis entitled "Ionizing radiation effects in nanoscale CMOS technologies exposed to ultra-high doses". He has authored and co-authored 17 journal and conference papers on the topic of radiation effects in modern CMOS technologies.